The focus of our research is on structure-properties relationships in thin-film materials and nanostructures. One specific group of materials that we explore, complex oxides, have many fascinating properties including superconductivity, magnetism, and ferroelectricity. These properties can be controlled by the crystal growth conditions and by external parameters such as temperature and electric field.
In our laboratory we have several instruments for synthesis of thin-film materials and for materials characterization. In addition, we use the state-of-the-art synchrotron radiation facilities at national labs. Motivated students are always welcome to join our research.
June-2013: Rigaku SmartLab X-ray Diffraction/Scattering system is operational.
Mar-7-2013: Instrumentation Lab module is featured on OriginLab wesite.
Feb-20-2013: New article is published: "Electrical measurements of dielectric nonlinearities in ferroelectric bilayer thin films"
Apr-7-2012: Tara Drwenski received an NSF Graduate Research Fellowship. Congratulations!
Dec-14-2011: "Ultrafast electrical measurements of polarization dynamics in ferroelectric thin-film capacitors" paper is published in Review of Scientific Insturment.
Sep-2-2011: rf-magnetron sputtering system is operational